
Timeline
About me
Characterization Engineer at STMicroelectronics
Education

Mindanao polytechnic state college
1998 - 2003Bachelor’s degree electrical and electronics engineering
Experience

Maxim integrated
Jan 2004 - Oct 2010Product engineerTest and Product Engineer (Jan. 2004 to Sep. 2010)Supported laser trimmed products while leading a laser maintenance team in maintaining 29 various laser systems (GSI M310, ESI 2050 and Teradyne M118). While my team does most of the routine work, I focus on process, software and hardware improvements for the laser systems.Accomplishments: - Supported the processing of blanket-trim lots by acting as the key person to disposition trim issues and resolve laser problems. - Calibration process optimizations. Automated the gathering, failure flagging and archiving of the calibration data. - Product transfers and production ramp-up. - Contributed in recruitment efforts particularly in the interviewing and screening of engineers and technicians. Provided sound recommendations to the managers regarding each applicant. Show less

On semiconductor
Oct 2010 - Aug 2017Senior product and test engineerWafer Sort and Final Test Product Engineer (Oct 2010 to Aug 2017)Pioneered IC testing and trimming in the Wafer Sort line of the Cebu Facility. - Technical and team lead. Trainor and mentor to new engineers. - - Ensure all manufacturing requirements are met in preparation for volume ramp up. - - Meet quality, yield and cycle time requirements of Cebu site. - New product introduction from qualification to volume ramp-up - Lead super user for Yield Management System (exensio-Yield). Create analysis templates, train users and review database data integrity.Accomplishments: - Qualified 30+ core products from the US, Malaysia and Korea. Met yield and parametric correlation criteria within tight project timelines. - Migrated 10+ products from MCT and ETS-564 to the ETS-364. - FT UIL loss reduction - Qualification & release of “High-current Wafer-level UIL testing” in Cebu. - Presented in the 2012 Fairchild Back-end technical sharing (Penang, Malaysia). - - Presentation: “Q/V parameter – Screening high RDSon dice in Wafer Sort” - Improved wafer sort yield of FDZ191P DMOS CSP device from 90% to 96% by correlating wafer level RDSon to singulated RDSon. Show less

Globalfoundries
Aug 2017 - Sept 2020Senior product engineerProduct engineer for PMIC devies in the 0.18um tech node. Manage yield and work with fab process engineers for improvement. - Translate test data to actionable information for fab process engineers. - Plan and request failure analysis activities and interpret results. - Analyze test and yield data to be able to provide sound recommendations to management. Tools used are KLArity ACE, Spotfire and JMP. - Data analysis automation projects. Recently completed a wafermap cluster detection project using R and the DBSCAN library. Currently working on Fab wide yield database and report automation. Show less

Stmicroelectronics
Sept 2020 - nowCharacterization engineerTest and Characterization Engineer handling new product development of mixed signal ASICs. - Bench testing for design validation and IP characterization - Test HW design
Licenses & Certifications
- View certificate

Edx honor code certificate for introduction to r
Edx - View certificate

Edx verified certificate for the analytics edge
Edx
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