Sriram Viswanathan

Experience

• 

  Essilor India

  Jun 2014 - Aug 2014

  Process Improvement Intern

  ⬧ Identified bottlenecks in opthalmic lens manufacturing and reorganized workload proportion to contain overall throughput ⬧ Implemented root cause analysis to reduce part defects and unscheduled equipment downtime⬧ Conducted verification & validation of ophthalmic lenses

• 

  Siemens

  Jun 2017 - Oct 2017

  Process Improvement Intern

  ⬧ Performed Bulk data analysis of resource utilization and developed MS Access database for knowledge management⬧ Co-implemented continuous improvement projects in product assembly and integration phase using cause-effect, FMEA and 8D problem solving approaches⬧ Developed capacity plan models to to boost tool utilization and expedite the assembly and shipping of Gas Chromatographic analyzers

• 

  UTAC

  Nov 2017 - Sept 2018

  Manufacturing Supervisor

  ⬧ Analyzed cycle time, production cap, WIP and manpower for resource allocation and scheduling to achieve OTD of parts⬧ Implemented handler DUT enhancement projects to improve testing rate⬧ Purchase and inventory management for QFP test sockets

• 

  Micron Technology

  Oct 2018 - now

  ⬧ Part of Fab Quality team fronting New Product Qualification and its ramp-up through problem resolution andcollaboration⬧ SME in reliability accountable for device reliability assessment through reliability scorecard generation⬧ Worked with Fab teams for in-line process control to mitigate variations/drifts in device reliability performance, and achieved 3 Tech Nodes Qualification ⬧ Enhanced and validated existing reliability tests to improve accuracy of Fail mode detection⬧ Worked on reliability assessment for device process DOEs and steered Fab teams towards the forward-looking conditions and ensured their interception on to Critical to Qual materials ⬧ Co-developed and deployed business process to reduce wait time for engineering requests to Reliability test and achieved wait time reduction of ~28% (21 days → 15 days )⬧ Pioneered Queue time control system into reliability test flow to reduce wait time induced variability in the measurement of key device reliability metricsTechnodes covered: RG: N140 TLC/QLC Show less

  • Staff Engineer, NAND Product Engineering

    Nov 2024 - now

  • Senior Engineer, NAND Product Engineering

    Dec 2021 - Nov 2024

  • Senior Engineer, NAND Cell Reliability

    Nov 2020 - Dec 2021

  • Engineer, NAND Cell Reliability

    Oct 2018 - Nov 2020