Alex Lim

Experience

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  Chartered Semiconductor

  Mar 2001 - Nov 2001

  Associate Engineer

  Coordinated with process and integration engineers to identify new 0.13um process DOI for yield and process improvementAnalyze data collected from experiments to improve and fine tune process capability for 0.13GCoordinate with manufacturing to ensure Engineering lots are processed and measurements collected as requestedCoordinated virtual fab activity leading to final selection of tool of record for 0.13G process

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  Chartered Semiconductors

  Nov 2001 - May 2003

  Associate Engineer

  Identified and characterized DOI for new process recipes resulting in driving yield improvement and improved inline defect healthIdentify and collect measurements to resolve inline defect excursions and yield excursions to maintain production capabilityActively involved as yield task force member to isolate yield critical DOI and solve process issues by identifying the root causeCoordinated with vendors to perform timely PM on inspection equipmentExpert in creating recipe and work with inspection tools and review tools like eS20, KLA 2138, KLA 2139, KLA 2351, AIT II, AIT-XP, Leica Optical Inspection tool, eV300, Semvision, Compass Show less

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  Chartered Semiconductor

  May 2003 - Sept 2003

  Associate Engineer

  Performed failure analysis on wafer level and package level rejects to identify failure mode and mechanism to feedback to product engineer for yield improvementActive member in yield enhancement task force to identify root cause for defect or design related failure modes

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  Chartered Semiconductor

  Nov 2003 - Jul 2005

  Engineer

  Managed major customer products to ensure wafers produced meet target yield for shipmentCoordinate with cross functional teams to ensure customer product wafers meet specifications ready for shippingTroubleshoot and debug customer rejects to identify root cause for failure at wafer and package levelCoordinated with cross functional teams to qualify new process and products base on customer requirements and specificationsSpearheaded yield enhancement task force to improve yield to increase revenueSetup and develop test programs for qualifying test houses for testing product wafersPlayed key role in setting up and qualification of in-house wafer sort and final test capabilityPerformed wafer and package level electrical testing, test result debugging and reject verifications for customer wafersPerformed yield analysis using YMS softwares to identify root cause for yield excursions Show less

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  KLA-Tencor

  Jul 2005 - now

  - Managed KLARITY ACE project for major Europe customer with a cross-functional team across regions to manage customer needs and expectations resulting in improved customer satisfaction leading to ~20% of product revenue every year- Conduct training and expertise support for defect and yield analysis software and provide best known solution to customers bringing in additional revenue for consulting services- Drive new process and SOPs to improve operation efficiency- Create user requirements document to communicate between customer and engineering to improve communication- Managed pre-sales activities and Head-to-head evaluations for potential customers leading to successful sales- Participate in roadmap and requirements reviews for KLARITY suite products- Applications lead for KLARITY Bitmap product to coordinate with regional applications engineer on on pre-sales and post-sales support activities- Work with customers to understand their yield problem statements to recommend and implement solutions using KLARITY suite products to solve their problems- Support WW activities for KLARITY Defect, KLARITY SSA, KLARITY ACE and KLARITY Bitmap- Managed special projects development for customers with consultation services to integrate customer solution with KLA-Tencor solutions- Managed beta activities for to be released products to identify potential issues that will impact customer adoption Show less

  • Product Marketing Manager

    Oct 2015 - now

  • Senior Solutions Consultant

    Jul 2005 - Oct 2015